Characterization of photo-degradation of a polyurethane coating system by electron spin resonance

被引:17
作者
He, Y [1 ]
Yuan, HP [1 ]
Cao, H [1 ]
Zhang, R [1 ]
Jean, YC [1 ]
Sandreczki, TC [1 ]
机构
[1] Univ Missouri, Dept Chem, Kansas City, MO 64110 USA
基金
美国国家科学基金会;
关键词
photo-degradation; ESR spectroscopy; polyurethane; coating;
D O I
10.1016/S0300-9440(01)00154-0
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Photo-degradation studied by electron spin resonance (ESR) is described. Selected polyurethane film samples were exposed to different accelerated aging environments. These included narrow-band irradiation from 340 and 313 nm UV sources, broadband irradiation from a xenon are lamp, and elevated temperature without irradiation. The effect of oxygen was investigated. In addition, the influence of titania on free radical formation was examined. Early stage radicals were detected by generating them in the ESR cavity at -196 degreesC. A correlation between ESR and positron annihilation spectroscopy (PAS) data is shown, which indicates that free-radical-type chemical defects may be the cause of sub-nanometer physical defects. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:75 / 81
页数:7
相关论文
共 33 条
[1]  
[Anonymous], PIGMENTS INTRO THEIR
[2]  
[Anonymous], 1994, ELECT PARAMAGNETIC R
[3]   RAPID, RELIABLE TESTS OF CLEARCOAT WEATHERABILITY - A PROPOSED PROTOCOL [J].
BAUER, DR ;
GERLOCK, JL ;
DICKIE, RA .
PROGRESS IN ORGANIC COATINGS, 1987, 15 (03) :209-221
[4]  
BIERWAGEN GP, 1996, ORGANIC COATINGS COR
[5]  
Cao H, 1999, J POLYM SCI POL PHYS, V37, P1289, DOI 10.1002/(SICI)1099-0488(19990615)37:12<1289::AID-POLB9>3.3.CO
[6]  
2-G
[7]   Degradation of polymer coating systems studied by positron annihilation spectroscopy. 1. UV irradiation effect [J].
Cao, H ;
Zhang, RW ;
Sundar, CS ;
Yuan, JP ;
He, Y ;
Sandreczki, TC ;
Jean, YC ;
Nielsen, B .
MACROMOLECULES, 1998, 31 (19) :6627-6635
[8]  
CARDON AH, 1991, DURABILITY POLYM BAS
[9]  
CHIMMAYANANDAM RB, 1954, T FARADAY SOC, V50, P73
[10]  
CLOUGH R, 1996, ACS ADV CHEM SERIES, V249