New set-up to measure the thermal diffusivity with an infrared camera

被引：4

作者：

Boué, C ^{[1
]}

Fournier, D ^{[1
]}

机构：

[1] ESPCI, UPMC, UPR A0005, Lab Opt Phys, F-75005 Paris, France

来源：

JOURNAL DE PHYSIQUE IV | 2005年 / 125卷

关键词：

D O I：

10.1051/jp4:2005125023

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present a new approach to measure the thermal diffusivity of materials. An infrared camera coupled with a "lock-in" system developed by CEDIP corporation detects the amplitude and the phase of the infrared emission on the surface of an heated sample. We show in this article that the thermal diffusivity can be calculated in all directions around the heating laser beam with the phase images more quickly than our conventional IR microscope system.

引用

页码：101 / 104

页数：4

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