The influence of contact interface characteristics on vibration-induced fretting degradation

被引:26
作者
Flowers, GT [1 ]
Xie, F [1 ]
Bozack, M [1 ]
Horvath, R [1 ]
Rickett, BI [1 ]
Malucci, RD [1 ]
机构
[1] Auburn Univ, Ctr Adv Vehicle Elect, Auburn, AL 36849 USA
来源
PROCEEDINGS OF THE FIFTY-FIRST IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS | 2005年
关键词
connectors; fretting degradation; random vibration;
D O I
10.1109/HOLM.2005.1518227
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Vibration induced fretting degradation is a widely recognized failure phenomenon; however, the basic mechanisms that control the onset and progression of such fretting behavior are not well understood and are a topic of considerable interest in the electrical connector community. One specific issue is the need for a more detailed understanding of the mechanisms controlling the fretting degradation. The present study addresses these questions and develops answers using the results from a series of experimental tests of sample connectors which are subjected to single-frequency vibration profiles at room temperature. These test specimens are a series of dual-row 16-circuit automotive connectors in which the plating finish and contact normal force are varied. The results are presented and discussed in light of earlier investigations.
引用
收藏
页码:82 / 88
页数:7
相关论文
共 12 条
[1]  
[Anonymous], P 45 IEEE HOLM C OCT
[2]  
ANTLE RM, 1984, P 29 IEEE HOLM C EL, P3
[3]  
Bock E. M., 1974, P 20 ANN HOLM SEM EL, P128
[4]  
BRAUNOVIC M, 1984, IEEE T COMPON HYBR, V7, P96, DOI 10.1109/TCHMT.1984.1136322
[5]   RESISTANCE BUILDUP IN ELECTRICAL CONNECTORS DUE TO FRETTING CORROSION OF ROUGH SURFACES [J].
BRYANT, MD .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1994, 17 (01) :86-95
[6]   A study of the physical characteristics of vibration-induced fretting corrosion [J].
Flowers, GT ;
Xie, F ;
Bozack, M ;
Hai, X ;
Rickett, BI ;
Malucci, RD .
ELECTRICAL CONTACTS-2004: PROCEEDINGS OF THE 50TH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS/THE 22ND INTERNATIONAL CONFERENCE ON ELECTRICAL CONTACTS, 2004, :312-319
[7]   Modeling early stage fretting of electrical connectors subjected to random vibration [J].
Flowers, GT ;
Xie, F ;
Bozack, M ;
Horvath, R ;
Malucci, RD ;
Rickett, BI .
PROCEEDINGS OF THE FORTY-NINTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 2003, :45-50
[8]  
Flowers GT, 2002, ELECTRICAL CONTACTS-2002: PROCEEDINGS OF THE FORTY-EIGHTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, P133, DOI 10.1109/HOLM.2002.1040833
[9]   Impact of fretting parameters on contact degradation [J].
Malucci, RD .
ELECTRICAL CONTACTS - 1996: PROCEEDINGS OF THE FORTY-SECOND IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS: JOINT WITH THE 18TH INTERNATIONAL CONFERENCE ON ELECTRICAL CONTACTS, 1996, :395-403
[10]   Fretting corrosion degradation, threshold behavior and contact instability [J].
Malucci, RD .
PROCEEDINGS OF THE FORTY-NINTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 2003, :2-15