Dynamics at crystal/melt interface during solidification of multicrystalline silicon

被引:7
|
作者
Fujiwara, Kozo [1 ]
Chuang, Lu-Chung [1 ]
Maeda, Kensaku [1 ]
机构
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
关键词
solidification; crystal; melt interface; semiconductor; grain boundary; MULTI-CRYSTALLINE SILICON; IN-SITU OBSERVATION; FACETED DENDRITE GROWTH; ANGLE GRAIN-BOUNDARIES; REAL-TIME OBSERVATION; BEAM-INDUCED CURRENT; DIRECTIONAL SOLIDIFICATION; POLYCRYSTALLINE SILICON; UNIDIRECTIONAL SOLIDIFICATION; FORMATION MECHANISM;
D O I
10.1515/htmp-2022-0020
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A fundamental understanding of crystal growth dynamics during directional solidification of multicrystalline Si (mc-Si) is crucial for the development of crystal growth technology for mc-Si ingots for use in solar cells. In situ observation of the crystal/melt interface is a way to obtain direct evidence of phenomena that occur at a moving crystal/melt interface during growth. In this review, some of the phenomena occurring in the solidification processes of mc-Si are introduced based on our in situ observation experiments, after a brief introduction of the history of the development of crystal growth technologies to obtain mc-Si ingots for solar cells.
引用
收藏
页码:31 / 47
页数:17
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