共 50 条
Dynamics at crystal/melt interface during solidification of multicrystalline silicon
被引:7
|作者:
Fujiwara, Kozo
[1
]
Chuang, Lu-Chung
[1
]
Maeda, Kensaku
[1
]
机构:
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
关键词:
solidification;
crystal;
melt interface;
semiconductor;
grain boundary;
MULTI-CRYSTALLINE SILICON;
IN-SITU OBSERVATION;
FACETED DENDRITE GROWTH;
ANGLE GRAIN-BOUNDARIES;
REAL-TIME OBSERVATION;
BEAM-INDUCED CURRENT;
DIRECTIONAL SOLIDIFICATION;
POLYCRYSTALLINE SILICON;
UNIDIRECTIONAL SOLIDIFICATION;
FORMATION MECHANISM;
D O I:
10.1515/htmp-2022-0020
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
A fundamental understanding of crystal growth dynamics during directional solidification of multicrystalline Si (mc-Si) is crucial for the development of crystal growth technology for mc-Si ingots for use in solar cells. In situ observation of the crystal/melt interface is a way to obtain direct evidence of phenomena that occur at a moving crystal/melt interface during growth. In this review, some of the phenomena occurring in the solidification processes of mc-Si are introduced based on our in situ observation experiments, after a brief introduction of the history of the development of crystal growth technologies to obtain mc-Si ingots for solar cells.
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页码:31 / 47
页数:17
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