Microstructure and texture of shear bands in cold rolled silicon steel single crystals of Goss orientation

An initially Goss-oriented ({110} < 001 > preferred crystal orientation) FeSi single crystal was cold rolled up to 89 % reduction in thickness. The microstructure and texture of shear bands, which develop at strains higher than 70 %, were investigated by the EBSD (electron backscatter diffraction) technique. The texture components within and ouside of the shear bands are the two symmetrical {111} < 112 > orientations and the {110}< 001 > orientation. We conclude that crystallographic slip is the deformation mechanism that is active both within and outside of the shear bands.