Characterization of ZnO crystals grown by the vertical Bridgman method

被引：1

作者：

Eisermann, Sebastian ^{[1
]}

Laufer, Andreas ^{[1
]}

Graubner, Swen ^{[1
]}

Pinnisch, Melanie ^{[1
]}

Stehr, Jan ^{[1
]}

Lautenschlaeger, Stefan ^{[1
]}

Hofmann, Detlev M. ^{[1
]}

Meyer, Bruno K. ^{[1
]}

Klimm, Detlev ^{[2
]}

Schulz, Detlev ^{[2
]}

机构：

[1] Univ Giessen, Inst Phys 1, D-35392 Giessen, Germany

[2] Leibniz Inst Kristallzuchtung, D-12489 Berlin, Germany

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2011年 / 208卷 / 01期

关键词：

Bridgman technique; crystal growth; defects; ZnO; SINGLE-CRYSTALS; ZINC-OXIDE; RESONANCE; MELT;

D O I：

10.1002/pssa.201026634

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

ZnO crystals grown by the vertical Bridgman technique were comprehensively characterized in view of the impurities and intrinsic defects in the material. It is shown that residual Al is the cause of the residual n-type conductivity and intrinsic defects play only a minor role in the samples. Annealing the samples at 1100 degrees C for 1 h in oxygen atmosphere improves the surface properties of the samples without having negative effects on their optical and electrical properties. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：37 / 41

页数：5

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