Impact of Negative Line Tension on the Shape of Nanometer-Size Sessile Droplets

被引：76

作者：

Berg, John K. ^{[1
]}

Weber, Constans M. ^{[1
]}

Riegler, Hans ^{[1
]}

机构：

[1] Max Planck Inst Colloids & Interfaces, D-14424 Potsdam, Germany

来源：

PHYSICAL REVIEW LETTERS | 2010年 / 105卷 / 07期

关键词：

ATOMIC-FORCE MICROSCOPY; WETTING TRANSITIONS; CONTACT ANGLES; SURFACES; INTERFACE; DOMAINS; FLUID; MODEL; MONOLAYERS; MEMBRANES;

D O I：

10.1103/PhysRevLett.105.076103

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The sign and value of the line tension has been measured from the size dependence of the contact angle of nanometer-size sessile fullerene (C(60)) droplets on the planar SiO(2) interface, measured with atomic force microscopy (AFM). Analysis according to the modified Young's equation indicates a negative line tension, with a magnitude between -10(-11) and -10(-10) N/m, in good agreement with theoretical predictions. The experiments also indicate that droplets with contact area radii below 10 nm are in fact two-dimensional round terraces.

引用

页数：4

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