Properties of bilayers based on Mo films for transition-edge sensors

被引：4
作者：
Rajteri, M
Monticone, E
Gandini, C
Portesi, C
Rocci, R
Bodoardo, S
机构：
[1] Ist Elettrotecnico Nazl Galileo Ferraris, I-10135 Turin, Italy
[2] Politecn Torino, Dipartimento Fis, I-10129 Turin, Italy
[3] Politecn Torino, Dipartimento Sci Mat & Ingn Chim, I-10129 Turin, Italy
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2003年 / 13卷 / 02期
关键词：
low temperatures; superconducting devices; thin films; transition-edge sensors;
D O I：
10.1109/TASC.2003.812291
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Transition-edge sensors (TES) are promising devices for materials science and space applications due to their spectroscopic capabilities and good count rates. In this-work, we report details on fabrication and characterization of Mo films and Mo/Ag bilayers; that, being immiscible and nonreactive with each other, should have a long time stability. Both single superconducting films and bilayers of normal-supprconducting materials have been deposited in UHV by e-gun. Structural and morphological properties have been investigated by x-ray diffraction and AFM. Bilayers with transition widths of. 1 mK are achievable, adequate to realize high sensitivity thermometers.
引用
收藏
页码：3292 / 3294
页数：3
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