Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

被引：2

作者：

Diaz-Valdes, E.

Mejia-Garcia, C.

Lopez-Lopez, J. L.

Jergel, M.

机构：

[1] IPN, Escuela Super Fis & Matemat, UPALM, Mexico City, DF, Mexico

[2] IPN, CINVESTAV, Dept Fis, Mexico City 07300, DF, Mexico

来源：

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2007年 / 18卷 / 11期

关键词：

Critical Temperature; Atomic Absorption Spectroscopy; Partial Evaporation; Spray Pyrolysis Technique; Small Lattice Mismatch;

D O I：

10.1007/s10854-007-9286-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi1.65Pb0.4Sr1.2Ca1.2Cu2.5(NO3)(delta) were grown varying mainly the annealing temperature between 835 and 855 degrees C in order to observe the influence on the critical temperature T-c. At 855 degrees C the higher T-c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

引用

页码：1167 / 1170

页数：4