Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

被引：2
|
作者：
Diaz-Valdes, E.
Mejia-Garcia, C.
Lopez-Lopez, J. L.
Jergel, M.
机构：
[1] IPN, Escuela Super Fis & Matemat, UPALM, Mexico City, DF, Mexico
[2] IPN, CINVESTAV, Dept Fis, Mexico City 07300, DF, Mexico
来源：
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2007年 / 18卷 / 11期
关键词：
Critical Temperature; Atomic Absorption Spectroscopy; Partial Evaporation; Spray Pyrolysis Technique; Small Lattice Mismatch;
D O I：
10.1007/s10854-007-9286-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi1.65Pb0.4Sr1.2Ca1.2Cu2.5(NO3)(delta) were grown varying mainly the annealing temperature between 835 and 855 degrees C in order to observe the influence on the critical temperature T-c. At 855 degrees C the higher T-c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.
引用
收藏
页码：1167 / 1170
页数：4
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