Depth-profile of residual stresses in metallic/ceramic coatings

The use of X-ray diffraction techniques provides the wide possibilities of applying non destructive tensometry, especially for coatings and near-surface layers. It consists in control of residual stresses arising after different technologies or exploitation conditions. In this paper the "sin(2)psi" method of X-ray stress measurement applied to analysis of its depth profile in Cr, and CrN/Cr coatings is presented. Explanation of physical origins of the stresses revealed by carried out experiments and prediction of the stress evolution in the examined coatings are discussed.