Atomic layer deposition of metal and nitride thin films: Current research efforts and applications for semiconductor device processing

被引:501
作者
Kim, H [1 ]
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 06期
关键词
D O I
10.1116/1.1622676
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Atomic layer deposition (ALD) has been studied for several decades now, but the interest in ALD of metal and nitride thin films, has increased only recently, driven by the need for highly conformal. nanoscale thin films in modern semiconductor device manufacturing technology. ALD is a very promising deposition technique with the ability to produce thin films with excellent conformality and compositional control with atomic scale dimensions. However, the applications of metals and nitrides ALD in semiconductor device processes require a deeper understanding about the underlying deposition process as well as the physical and electrical properties of the deposited films. This article reviews the current research efforts in ALD for metal and nitride films as well as their applications in modem semiconductor device fabrication. (C) 2003 American Vacuum Society.
引用
收藏
页码:2231 / 2261
页数:31
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