Ultra-narrow-linewidth measurement utilizing dual-parameter acquisition through a partially coherent light interference

被引：37

作者：

Wang, Zhihui ^{[1
]}

Ke, Changjian ^{[1
,2
]}

Zhong, Yibo ^{[1
]}

Xing, Chen ^{[1
]}

Wang, Haoyu ^{[1
]}

Yang, Keyuan ^{[1
]}

Cui, Sheng ^{[1
,2
]}

Liu, Deming ^{[1
,2
]}

机构：

[1] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China

[2] Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China

来源：

OPTICS EXPRESS | 2020年 / 28卷 / 06期

基金：

中国国家自然科学基金;

关键词：

FREQUENCY-NOISE; LASER LINEWIDTH; SPECTRAL-RESOLUTION;

D O I：

10.1364/OE.387398

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Laser linewidths of the order of 100 Hz are challenging to measure with existing technology. We propose a simple, efficient method to measure ultra-narrow linewidths using dual-parameter acquisition based on partially coherent light interference. The linewidth is obtained using two parameters that are easily extracted from the power spectrum. This method reduces the influence of 1/f noise by utilizing a kilometer-order-length delay fiber and is independent of the fiber-length error for a general situation. Simulation results show that, for a length error less than 10%, the total linewidth measurement error is less than 0.3%. Experimental results confirm the feasibility and superior performance of this method. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：8484 / 8493

页数：10

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