Investigation of nanoscale frictional contact by friction force microscopy

被引:20
作者
Wei, ZQ
Wang, C
Bai, CL [1 ]
机构
[1] Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Mol Sci, Beijing 100080, Peoples R China
关键词
D O I
10.1021/la001185q
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Organsilane self-assembled monolayers (SAMs) deposited on mica (APTES/mica and OTS/mica) were investigated by friction force microscopy in air. The frictional force as a function of load was found not to be entirely subject to linear law, especially when the loads were kept low. The JKR model, the DMT model, and the transition regime between these two can be employed to describe the nanoscale contacts. We analyzed and fitted the measured frictional data using the modified Carpick's transition equation. The transition parameter, alpha, extracted from the fitting was used to determine which model should be used to describe the contacts. We found that the frictions both for the tip-APTES/mica system and the tip-OTS system could be described by the transition regime between JKR and DMT models. In addition, using the Carpick's transition equations, we determined the adhesion energies for the tip-sample contacts. This study implies a method to identify the accuracy of a particular continuum model to describe the nanoscale contacts. Considering that many previous studies assumed the contacts were completely subject to either the JKR model or the DMT model, we believe that this work will provide us with more realistic information concerning the nanoscale contacts.
引用
收藏
页码:3945 / 3951
页数:7
相关论文
共 47 条
[1]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[2]   Friction of the liquid crystal 8CB as probed by the surface forces apparatus [J].
Artsyukhovich, A ;
Broekman, LD ;
Salmeron, M .
LANGMUIR, 1999, 15 (06) :2217-2223
[3]   Relationship between friction and molecular structure: Alkylsilane lubricant films under pressure [J].
Barrena, E ;
Kopta, S ;
Ogletree, DF ;
Charych, DH ;
Salmeron, M .
PHYSICAL REVIEW LETTERS, 1999, 82 (14) :2880-2883
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]  
BOWDEN FP, 1964, FRICTION LUBRICATI 1
[6]   PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].
BURNHAM, NA ;
DOMINGUEZ, DD ;
MOWERY, RL ;
COLTON, RJ .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934
[7]   A general equation for fitting contact area and friction vs load measurements [J].
Carpick, RW ;
Ogletree, DF ;
Salmeron, M .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1999, 211 (02) :395-400
[8]   Variation of the interfacial shear strength and adhesion of a nanometer-sized contact [J].
Carpick, RW ;
Agrait, N ;
Ogletree, DF ;
Salmeron, M .
LANGMUIR, 1996, 12 (13) :3334-3340
[9]   Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope [J].
Carpick, RW ;
Agrait, N ;
Ogletree, DF ;
Salmeron, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1289-1295
[10]   Scratching the surface: Fundamental investigations of tribology with atomic force microscopy [J].
Carpick, RW ;
Salmeron, M .
CHEMICAL REVIEWS, 1997, 97 (04) :1163-1194