Evaluating Creep Deformation in Controlled Microstructures of Sn-3Ag-0.5Cu Solder

被引:7
作者
Gu, Tianhong [1 ]
Gourlay, Christopher M. [1 ]
Britton, T. Ben [1 ]
机构
[1] Imperial Coll London, Dept Mat, London SW7 2AZ, England
基金
英国工程与自然科学研究理事会;
关键词
Pb-free solder; creep; microstructure evolution; recrystallization; TERNARY 95.5SN-3.9AG-0.6CU SOLDER; AG-CU SOLDERS; MECHANICAL-PROPERTIES; BULK SOLDER; PART II; SN; BEHAVIOR; JOINTS; ALLOYS; TIN;
D O I
10.1007/s11664-018-6744-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reliability of solder joints is affected significantly by thermomechanical properties such as creep and thermal fatigue. In this work, the creep of directionally solidified (DS) Sn-3Ag-0.5Cu wt.% (SAC305) dog-bone samples (gauge dimension: 10x2x1.5mm) with a controlled < 110 > or < 100 > fibre texture is investigated under constant load testing (stress level:approximate to 30MPa) at a range of temperatures from 20 degrees C to 200 degrees C. Tensile testing is performed and the secondary creep strain rate and the localised strain gradient are studied by two-dimensional optical digital image correlation (2-D DIC). The dominating creep mechanisms and their temperature dependence are explored at the microstructural scale using electron backscatter diffraction (EBSD), which enables the understanding of the microstructural heterogeneity of creep mechanisms at different strain levels, temperatures and strain rates. Formation of subgrains and the development of recrystallization are observed with increasing strain levels. Differences in the deformation of -Sn in dendrites and in the eutectic regions containing Ag3Sn and Cu6Sn5 are studied and related to changes in local deformation mechanisms.
引用
收藏
页码:107 / 121
页数:15
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