Blind separation of manufacturing variability with independent component analysis: A convolutive approach

被引:8
|
作者
Gandini, M. [1 ]
Lombardi, F. [1 ]
Vaccarino, F. [2 ,3 ]
机构
[1] Politecn Torino, Dept Prod Syst & Business Econ, I-10129 Turin, Italy
[2] Politecn Torino, Dept Math, I-10129 Turin, Italy
[3] ISI Fdn, I-10133 Turin, Italy
关键词
Independent component analysis; Blind source separation; Technological fingerprint; Manufacturing engineering; Geometrical product specification; ALGORITHM;
D O I
10.1016/j.eswa.2011.02.036
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, we apply the blind source separation model to the scope of extracting information from a workpiece about the process that made it. Given any manufactured workpiece, we may think about it as the carrier of the information built in the process that made it. Using recent inspection technologies such as stylus profiler, we are able to generate signals from a workpiece. We analyze these signals using independent component analysis (ICA) in its various formulations. In doing this, we develop a convolutive version of ICA to overcome technical and metrological problems arisen. By using this convolutive modification of ICA we are able to demix the recorded signal and to recover the technological fingerprint over it. Simulations on NIST benchmarks are included, as well as a case study on a turned workpiece. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:9939 / 9946
页数:8
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