Fast linear electro-optic effect in a centrosymmetric semiconductor

被引:31
作者
Berciano, Mathias [1 ]
Marcaud, Guillaume [1 ]
Damas, Pedro [1 ]
Le Roux, Xavier [1 ]
Crozat, Paul [1 ]
Ramos, Carlos Alonso [1 ]
Galacho, Diego Perez [1 ]
Benedikovic, Daniel [1 ]
Marris-Morini, Delphine [1 ]
Cassan, Eric [1 ]
Vivien, Laurent [1 ]
机构
[1] Univ Par Sud, Univ Par Saclay, CNRS, C2N,UMR 9001, F-91405 Orsay, France
来源
COMMUNICATIONS PHYSICS | 2018年 / 1卷
基金
欧洲研究理事会;
关键词
SILICON WAVE-GUIDES; STRAINED SILICON; MODULATORS; PHOTONICS; REFLECTION;
D O I
10.1038/s42005-018-0064-x
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Silicon photonics, considered as a major photonic platform for optical communications in data centers, is today also developed for others applications including quantum photonics and sensing. Advanced silicon functionalities based on optical nonlinearities are then required. As the presence of inversion symmetry in the Si crystal structure prevents the exploitation of second-order optical nonlinearities, the generation of strain gradients in Si by a stressed material can be considered. However, due to the semiconductor nature of silicon with the presence of carriers, no clear evidence of second-order nonlinearities have been reported yet. Here we report an experimental demonstration of high-speed Pockels effect in silicon waveguides at 1550 nm. Additionally, a theoretical model is developed to describe its frequency behavior. A second-order nonlinear susceptibility. chi((2))(xxy) of -1.8 +/- 0.2 pm V-1 is then experimentally determined. These results pave the way for the development of fast linear electro-optic effect for advanced silicon photonics devices.
引用
收藏
页数:9
相关论文
共 33 条
[21]   Strain-designed strategy to induce and enhance second-harmonic generation in centrosymmetric and noncentrosymmetric materials [J].
Luppi, Eleonora ;
Degoli, Elena ;
Bertocchi, Matteo ;
Ossicini, Stefano ;
Veniard, Valerie .
PHYSICAL REVIEW B, 2015, 92 (07)
[22]   Modeling of strain-induced Pockels effect in silicon [J].
Manganelli, C. L. ;
Pintus, P. ;
Bonati, C. .
OPTICS EXPRESS, 2015, 23 (22) :28649-28666
[23]   THIN SILICON FILM P-I-N PHOTO-DIODES WITH INTERNAL-REFLECTION [J].
MULLER, J .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (01) :173-179
[24]   On the influence of interface charging dynamics and stressing conditions in strained silicon devices [J].
Olivares, Irene ;
Angelova, Todora ;
Sanchis, Pablo .
SCIENTIFIC REPORTS, 2017, 7
[25]   Tensor of the second-order nonlinear susceptibility in asymmetrically strained silicon waveguides: analysis and experimental validation [J].
Puckett, Matthew W. ;
Smalley, Joseph S. T. ;
Abashin, Maxim ;
Grieco, Andrew ;
Fainman, Yeshaiahu .
OPTICS LETTERS, 2014, 39 (06) :1693-1696
[26]   Heterogeneous lithium niobate photonics on silicon substrates [J].
Rabiei, Payam ;
Ma, Jichi ;
Khan, Saeed ;
Chiles, Jeff ;
Fathpour, Sasan .
OPTICS EXPRESS, 2013, 21 (21) :25573-25581
[27]  
Reed GT, 2010, NAT PHOTONICS, V4, P518, DOI [10.1038/NPHOTON.2010.179, 10.1038/nphoton.2010.179]
[28]   Characterizing the effects of free carriers in fully etched, dielectric-clad silicon waveguides [J].
Sharma, Rajat ;
Puckett, Matthew W. ;
Lin, Hung-Hsi ;
Vallini, Felipe ;
Fainman, Yeshaiahu .
APPLIED PHYSICS LETTERS, 2015, 106 (24)
[29]   ELECTROOPTICAL EFFECTS IN SILICON [J].
SOREF, RA ;
BENNETT, BR .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1987, 23 (01) :123-129
[30]  
Sze S. M., 2021, Physics of Semiconductor Devices