Angular response of perforated silicon diode high efficiency neutron detectors

被引：11

作者：

Bellinger, S. L. ^{[1
]}

McNeil, W. J. ^{[1
]}

Unruh, T. C. ^{[1
]}

McGregor, D. S. ^{[1
]}

机构：

[1] Kansas State Univ, SMART Lab, Manhattan, KS 66506 USA

来源：

2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11 | 2007年

关键词：

D O I：

10.1109/NSSMIC.2007.4436528

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Perforated silicon diodes with two different etched patterns were tested for neutron counting efficiency and angular response. The etched patterns consisted of circular holes on a square lattice or continuous sinusoidal waves. Normal incident neutron counting efficiencies were determined to be 21% and 35% for circular hole and sinusoidal devices, respectively. A non-uniform angular response was identified for the circular hole perforated devices. For the circular hole patterns, a reduction in efficiency appeared at azimuthal angles near 0 degrees and 90 degrees, each referenced at a 90 degrees polar angle about the normal aids. The non-uniform angular response is due to neutron streaming paths through the square lattice. The sinusoidal device angular response was uniform and matched well to that of a standard simple planar device.

引用

页码：1904 / 1907

页数：4

共 5 条

[1] Design considerations for thin film coated semiconductor thermal neutron detectors - I: basics regarding alpha particle emitting neutron reactive films [J].

McGregor, DS ;

Hammig, MD ;

Yang, YH ;

Gersch, HK ;

Klann, RT .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 500 (1-3) :272-308

[2]

MCGREGOR DS, 2007, RAD PHYS CH IN PRESS

[3]

McNeil WJ, 2006, IEEE NUCL SCI CONF R, P3732

[4] Efficiencies of coated and perforated semiconductor neutron detectors [J].

Shultis, JK ;

McGregor, DS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (03) :1659-1665

[5]

SOLOMON CJ, 2007, IEEE NSS OCT

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