Electro-optic mapping systems of electric-field using CW laser diodes

被引：4

作者：

Kuo, WK

Pai, CH

Huang, SL

Chou, HY

Huang, HS

机构：

[1] Natl Huwei Univ Sci & Technol, Dept Electroopt Engn, Yunlin 63208, Taiwan

[2] Natl Sun Yat Sen Univ, Inst Electroopt Engn, Kaohsiung, Taiwan

来源：

OPTICS AND LASER TECHNOLOGY | 2006年 / 38卷 / 02期

关键词：

electric field measurement; electro-optic mapping; laser diode; VCSEL;

D O I：

10.1016/j.optlastec.2004.10.009

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Two novel systems are proposed to perform the electro-optic (EO) mapping of the electric-field strength close to electrode structure using CW laser diodes. By these systems, mappings of both static (DC) and high-frequency electric-field can be obtained. For the static field, the field is chopped to increase the sensitivity performance. For the high-frequency field, an intensity modulation laser, instead of a pulse laser, is used to perform the mapping measurement in frequency domain, instead of in time domain. This approach greatly simplifies the system. An experiment set-up using a vertical cavity surface emitted laser diode (VCSEL) of a wavelength 850 nm and its mapping results for a coplanar waveguide (CPW) with the signal frequency around I GHz are reported. (c) 2004 Elsevier Ltd. All rights reserved.

引用

页码：111 / 116

页数：6