Electro-optic mapping systems of electric-field using CW laser diodes

被引：4
|
作者：
Kuo, WK
Pai, CH
Huang, SL
Chou, HY
Huang, HS
机构：
[1] Natl Huwei Univ Sci & Technol, Dept Electroopt Engn, Yunlin 63208, Taiwan
[2] Natl Sun Yat Sen Univ, Inst Electroopt Engn, Kaohsiung, Taiwan
来源：
OPTICS AND LASER TECHNOLOGY | 2006年 / 38卷 / 02期
关键词：
electric field measurement; electro-optic mapping; laser diode; VCSEL;
D O I：
10.1016/j.optlastec.2004.10.009
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Two novel systems are proposed to perform the electro-optic (EO) mapping of the electric-field strength close to electrode structure using CW laser diodes. By these systems, mappings of both static (DC) and high-frequency electric-field can be obtained. For the static field, the field is chopped to increase the sensitivity performance. For the high-frequency field, an intensity modulation laser, instead of a pulse laser, is used to perform the mapping measurement in frequency domain, instead of in time domain. This approach greatly simplifies the system. An experiment set-up using a vertical cavity surface emitted laser diode (VCSEL) of a wavelength 850 nm and its mapping results for a coplanar waveguide (CPW) with the signal frequency around I GHz are reported. (c) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码：111 / 116
页数：6
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