Diffusion lengths of excited carriers in CdxZn1-xSe quantum wells

被引:13
作者
Chao, LL
Cargill, GS
Snoeks, E
Marshall, T
Petruzzello, J
Pashley, M
机构
[1] Columbia Univ, Dept Chem Engn Mat Sci & Min Engn, New York, NY 10027 USA
[2] Philips Elect N Amer Corp, Philips Res, Briarcliff Manor, NY 10510 USA
关键词
D O I
10.1063/1.123109
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diffusion lengths of excited carriers in a CdxZn1-xSe multiple quantum well structure were determined for temperatures between room temperature and 8 K from cathodoluminescence measurements. The diffusion length was found to depend upon temperature and Cd concentration of the quantum well. For the highest Cd concentration (x=0.43), the diffusion length increased with temperature up to 225 K and then dropped at higher temperatures. Diffusion lengths were 0.21 mu m at 8 K, 0.38 mu m at 225 K, and 0.24 mu m at room temperature. For the well with least Cd concentration (x=0.24), longer diffusion lengths were obtained. The nature of the diffusing carriers is also discussed. (C) 1999 American Institute of Physics. [S0003-6951(99)03905-4].
引用
收藏
页码:741 / 743
页数:3
相关论文
共 22 条
[1]   DEFORMATION POTENTIALS AND MOBILITIES IN NON-POLAR CRYSTALS [J].
BARDEEN, J ;
SHOCKLEY, W .
PHYSICAL REVIEW, 1950, 80 (01) :72-80
[2]   EXCITON AND FREE CARRIER DYNAMICS IN GAAS QUANTUM-WELLS - EXCITATION DENSITY EFFECTS [J].
BLOCK, D ;
ROMESTAIN, R ;
EDEL, P ;
FRANKE, S .
JOURNAL OF LUMINESCENCE, 1992, 53 (1-6) :339-344
[3]   Cathodoluminescence study of GaAs quantum wells and of submicron dots fabricated by magnetron reactive ion etching [J].
Chao, LL ;
Cargill, GS ;
Levy, M ;
Osgood, RM ;
McLane, GF .
APPLIED PHYSICS LETTERS, 1997, 70 (04) :408-410
[4]   Activation energy of nonradiative processes in degraded II-VI laser diodes [J].
Chao, LL ;
Cargill, GS ;
Kothandaraman, C ;
Marshall, T ;
Snoeks, E ;
Buijs, M ;
Haberern, K ;
Petruzzello, J ;
Haugen, GM ;
Law, KK .
APPLIED PHYSICS LETTERS, 1997, 70 (05) :535-537
[5]  
CHAO LL, 1996, MATER RES SOC S P, V406, P541
[6]   Strain-induced band-gap modulation in GaAs/AlGaAs quantum-well structure using thin-film stressors [J].
Deng, F ;
Liu, QZ ;
Yu, LS ;
Guan, ZF ;
Lau, SS ;
Redwing, JM ;
Geisz, J ;
Kuech, TF .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (03) :1763-1771
[7]   PHOTO-ELECTROCHEMICAL DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH IN II-VI-COMPOUNDS [J].
GAUTRON, J ;
LEMASSON, P .
JOURNAL OF CRYSTAL GROWTH, 1982, 59 (1-2) :332-337
[8]   TEMPERATURE-DEPENDENCE OF THE RADIATIVE AND NONRADIATIVE RECOMBINATION TIME IN GAAS/ALXGA1-XAS QUANTUM-WELL STRUCTURES [J].
GURIOLI, M ;
VINATTIERI, A ;
COLOCCI, M ;
DEPARIS, C ;
MASSIES, J ;
NEU, G ;
BOSACCHI, A ;
FRANCHI, S .
PHYSICAL REVIEW B, 1991, 44 (07) :3115-3124
[9]   DIFFUSION LENGTH OF HOLES IN N-ZNSE MEASURED BY SCHOTTKY-BARRIER PHOTOVOLTAGE METHOD [J].
KARIYAZONO, H ;
IDO, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (4A) :1835-1836
[10]  
KRELLNER F, 1995, APPL PHYS LETT, V69, P2406