Optical properties of thin films of poly(methyl-phenylsilylene)

被引：26
|
作者：
Navrátil, K
Sik, J
Humlícek, J
Nespurek, S
机构：
[1] Masaryk Univ, Fac Sci, Dept Solid State Phys, Lab Thin Films & Nanostruct, CZ-61137 Brno, Czech Republic
[2] Acad Sci Czech Republ, Inst Macromol Chem, CZ-16206 Prague, Czech Republic
来源：
OPTICAL MATERIALS | 1999年 / 12卷 / 01期
关键词：
poly(methyl-phenyl)silylene; thin film; dielectric functions; optical constants;
D O I：
10.1016/S0925-3467(98)00055-X
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV. This optical database is listed in tabular form. Four absorption bands are clearly observable in the range below 7 eV. We have also performed a comparison with the transmission data from solutions. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：105 / 113
页数：9
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