Optical properties of thin films of poly(methyl-phenylsilylene)

被引：26

作者：

Navrátil, K

Sik, J

Humlícek, J

Nespurek, S

机构：

[1] Masaryk Univ, Fac Sci, Dept Solid State Phys, Lab Thin Films & Nanostruct, CZ-61137 Brno, Czech Republic

[2] Acad Sci Czech Republ, Inst Macromol Chem, CZ-16206 Prague, Czech Republic

来源：

OPTICAL MATERIALS | 1999年 / 12卷 / 01期

关键词：

poly(methyl-phenyl)silylene; thin film; dielectric functions; optical constants;

D O I：

10.1016/S0925-3467(98)00055-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV. This optical database is listed in tabular form. Four absorption bands are clearly observable in the range below 7 eV. We have also performed a comparison with the transmission data from solutions. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：105 / 113

页数：9

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