In situ flaw detection by IR-imaging during electron beam melting

被引：119
作者：
Schwerdtfeger, Jan [1 ]
Singer, Robert E. [2 ]
Koerner, Carolin [2 ]
机构：
[1] Univ Erlangen Nurnberg, ZMP, Furth, Germany
[2] Univ Erlangen Nurnberg, WTM, D-91054 Erlangen, Germany
来源：
RAPID PROTOTYPING JOURNAL | 2012年 / 18卷 / 04期
关键词：
Manufacturing systems; Infra-red devices; Process control; Electron beam melting; Infrared imaging; FABRICATION; TECHNOLOGY; TITANIUM;
D O I：
10.1108/13552541211231572
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Purpose - The purpose of this paper is to investigate the possibility of in situ flaw detection for powder bed, beam-based additive manufacturing processes using a thermal imaging system. Design/methodology/approach - The authors compare infrared images (IR) which were taken during the generation of Ti-6Al-4V parts in a selective electron beam melting system (SEBM) with metallographic images taken from destructive material investigation. Findings - A good match is found between the IR images and the material flaws detected by metallographic techniques. Research limitations/implications - First results are presented here, mechanisms of flaw formation and transfer between build layers are not addressed in detail. Originality/value - This work has important implications for quality assurance in SEBM and rapid manufacturing in general.
引用
收藏
页码：259 / 263
页数：5
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