Fine pitch CdTe-based hard-X-ray polarimeter performance for space science in the 70-300 keV energy range

被引:2
作者
Antier, S. [1 ]
Limousin, O. [1 ]
Ferrando, P. [1 ]
机构
[1] CEA Saclay, CEA Irfu, F-91191 Gif Sur Yvette, France
关键词
Hard X-ray astrophysics; Compton scattering; Polarimetry; Schotty CdTe CZT; Pixel detectors; Spectroscopy; EMISSION;
D O I
10.1016/j.nima.2014.12.085
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-rays astrophysical sources have been almost characterized through imaging, spectroscopy and timing analysis. Nevertheless, more observational parameters such as polarization are needed because some radiation mechanisms present in gamma-ray sources are still unclear. We have developed a CdTe based fine-pitch imaging spectrometer, Caliste to study polarization. With a 58-micron pitch and 1 keV energy resolution at 60 keV, we are able to accurately reconstruct the polarization angle and fraction of an impinging flux of photons which are scattered by 90 after Compton diffusion within the crystal. In this paper, we present the principles and the results obtained for this kind of measurements: on one hand, we compare simulations results with experimental data taken at ESRF ID15A (European Synchrotron Radiation Facility) using a 35-300 keV mono-energetic polarized beam. Applying a judicious energy selection to our data set, we reach a remarkable sensitivity level characterized by a measured Quality factor of 0.78 +/- 0.02 in the 200-300 keV range; and a measured Q factor of 0.64 +/- 0.0 at 70 keV where hard X-rays mirrors are already available. (C) 2014 Elsevier B.V. All rights reserved
引用
收藏
页码:297 / 301
页数:5
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