Wetting behavior of eutectic Au-Sn solder on Ni/Au metallization at different temperatures

被引:6
|
作者
Wang, Jie [1 ]
Wu, Yiping [1 ]
Chen, Weimin [2 ]
Xie, Yangquan [2 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Mat Sci & Engn, Wuhan 430074, Peoples R China
[2] Guangzhou Xianyi Elect Technol Co Ltd, Guangzhou 511450, Peoples R China
关键词
SURFACE-TENSION; RELIABILITY; WETTABILITY; DISSOLUTION; SUBSTRATE; VISCOSITY; STRENGTH; JOINTS;
D O I
10.1007/s10854-021-07227-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Au-Sn solder is a high reliable lead-free solder with excellent oxidation resistance which is commonly used in fluxless soldering. In this paper, the wetting behavior of eutectic Au-Sn solder on Ni/Au metallization was studied by the usage of in situ observation of the wetting process of the solder. The results showed that the spreading area of the solder grew and the spreading time decreased with the increase of temperature. The rapid dissolution of Au layer into Au-Sn solder made the content of Au in the contact line (CL) region to reach saturation. The interfacial reaction products precipitated in the CL region impeded the spreading of the solder. As a result, the maximum spreading area was reached in a short time, indicating the high dimensional stability of the molten solder spreading on the substrate. (Au, Ni)(3)Sn-2 formed between Au5Sn layer and Ni layer was founded in the contact line region during the interfacial reaction after the spreading of the solder tended to a halt.
引用
收藏
页码:1774 / 1782
页数:9
相关论文
共 50 条
  • [31] The microstructure characterization of ultrasmall eutectic Bi-Sn solder bumps on Au/Cu/Ti and Au/Ni/Ti under-bump metallization
    Un-Byoung Kang
    Young-Ho Kim
    Journal of Electronic Materials, 2004, 33 : 61 - 69
  • [32] Effect of Ni on the Au embrittlement in Sn/Au/Ni solder bump
    Tao Wang
    Hailong Li
    Shiguang Hao
    Xuehong Zhang
    Journal of Materials Science: Materials in Electronics, 2021, 32 : 28426 - 28435
  • [33] Effect of Ni on the Au embrittlement in Sn/Au/Ni solder bump
    Wang, Tao
    Li, Hailong
    Hao, Shiguang
    Zhang, Xuehong
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021, 32 (24) : 28426 - 28435
  • [34] Interfacial reaction phenomena of Sn-Pb solder with Au/Ni/Cu metallization
    Alam, MO
    Chan, YC
    CHEMISTRY OF MATERIALS, 2005, 17 (05) : 927 - 930
  • [35] Effect of multiple flip-chip assembly on the mechanical reliability of eutectic Au-Sn solder joint
    Chu, Kunmo
    Park, Sunghoon
    Lee, Changseung
    Sohn, Yoonchul
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 27 (09) : 9941 - 9946
  • [36] Investigation of interfacial reaction between Sn-Ag eutectic solder and Au/Ni/Cu/Ti thin film metallization
    J. Y. Park
    C. W. Yang
    J. S. Ha
    C. -U. Kim
    E. J. Kwon
    S. B. Jung
    C. S. Kang
    Journal of Electronic Materials, 2001, 30 : 1165 - 1170
  • [37] Investigation of interfacial reaction between Sn-Ag eutectic solder and Au/Ni/Cu/Ti thin film metallization
    Park, JY
    Yang, CW
    Ha, JS
    Kim, CU
    Kwon, EJ
    Jung, SB
    Kang, CS
    JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (09) : 1165 - 1170
  • [38] Microstructure of Au-Sn eutectic bumps prepared by sequential electroplating
    Pan, Jian-Ling
    Huang, Ming-Liang
    Zhao, Ning
    Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals, 2012, 22 (07): : 2016 - 2022
  • [39] BONDING OF INP LASER-DIODES BY AU-SN SOLDER AND TUNGSTEN-BASED BARRIER METALLIZATION SCHEMES
    LEE, CH
    TAI, KL
    BACON, DD
    DOHERTY, C
    KATZ, A
    WONG, YM
    LANE, E
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1994, 9 (04) : 379 - 386
  • [40] A simple process for electrodeposition of Sn-rich, Au-Sn solder films
    Watt, Charles
    Liu, Qi
    Ivey, Douglas G.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (02) : 827 - 837