Characterization and field-emission properties of needle-like zinc oxide nanowires grown vertically on conductive zinc oxide films

被引:409
作者
Tseng, YK
Huang, CJ
Cheng, HM
Lin, IN
Liu, KS
Chen, IC [1 ]
机构
[1] Ind Technol Res Inst, Mat Res Labs, Hsinchu 310, Taiwan
[2] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[3] Natl Tsing Hua Univ, Ctr Mat Sci, Hsinchu 300, Taiwan
关键词
D O I
10.1002/adfm.200304434
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Needle-like ZnO nanowires with high density are grown uniformly and vertically over an entire Ga-doped conductive ZnO film at 550degreesC. The nanowires are grown preferentially in the c-axis direction. The X-ray diffraction (XRD) theta-scan curve shows a full width at half maximum (FWHM) value of 2degrees. The indicates that the c-axis of the nanorods are along the normal direction of the substrate surface. The investigation using high-resolution transmission electron microspray (HRTEM) confirmed that each nanowire is a single crystal. A room-temperature photoluminescence (PL) spectrum of the wires consists of a string and sharp UV emission band at 380 nm and at 380 nm and a weak and broad green-yellow band. It reveals a low concentration of oxygen vacancies in the ZnO nanowires and their high optical quality. Filed electron emission from the wires was also investigated. The turn-on field for the ZnO nanowires reached 0.1 mA cm(-2) at a bias filed of 24 V mum(-1).
引用
收藏
页码:811 / 814
页数:4
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