Nonlocal screening effects in 2p x-ray photoemission spectroscopy of NiO(100)

被引：154

作者：

Alders, D ^{[1
]}

Voogt, FC ^{[1
]}

Hibma, T ^{[1
]}

Sawatzky, GA ^{[1
]}

机构：

[1] UNIV GRONINGEN,CTR MAT SCI,DEPT CHEM PHYS,NL-9747 AG GRONINGEN,NETHERLANDS

来源：

PHYSICAL REVIEW B | 1996年 / 54卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.54.7716

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report on the layer thickness dependence of Ni 2p core-level line shapes of epitaxially grown, in a layer-by-layer fashion, NiO on a single-crystal MgO (100) substrate. The results demonstrate the sensitivity of the core-level line shape to the nearest as well as next-nearest-neighbor coordination number. The results are consistent with a recent theoretical study of nonlocal screening effects.

引用

页码：7716 / 7719

页数：4

共 25 条

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