Throughput measurement of a multilayer-coated Schwarzschild objective using synchrotron radiation

被引：1
作者：
Kiyokura, T
Maeda, F
Watanabe, Y
Iketaki, Y
Nagai, K
Horikawa, Y
Oshima, M
Shigemasa, E
Yagishita, A
机构：
[1] NTT, Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
[2] Olympus Opt Co Ltd, Hachioji, Tokyo 1928512, Japan
[3] Univ Tokyo, Dept Appl Chem, Bunkyo Ku, Tokyo 1138656, Japan
[4] High Energy Accelerator Res Org, Tsukuba, Ibaraki 3050801, Japan
来源：
OPTICAL REVIEW | 2000年 / 7卷 / 06期
关键词：
Schwarzschild objective multilayer; synchrotron radiation; throughput; soft X-ray; monochromator;
D O I：
10.1007/s10043-000-0576-x
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The throughput of a Schwarzschild objective using undulator synchrotron radiation was measured. Conventionally, the throughput was estimated from the squared reflectivity of one multilayer mirror and from the obstruction ratio. However, we evaluated the transmission ratio from the input and output photon flux using a precisely calibrated monochromatic beam from an undulator light source. It was found that the objective has a maximum throughput of 8.5% at a wavelength of 13.9 nm.
引用
收藏
页码：576 / 578
页数：3
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