Using infrared thermal responses for PCBA production tests: Feasibility study

被引:7
作者
Alaoui, Nabil El Belghiti [1 ,2 ]
Cassou, Anais [1 ]
Tounsi, Patrick [1 ]
Boyer, Alexandre [1 ]
Viard, Arnaud [2 ]
机构
[1] Univ Toulouse, LAAS, INSA, Lab CNRS, 7 Ave Colonel Roche, F-31400 Toulouse, France
[2] ACTIA Automot, 5 Rue Jorge Semprun, F-31400 Toulouse, France
关键词
Testability; Accessibility; Defect detection; PCBA testing; Thermal signatures; Contactless testing; Principal component analysis; Thermal modeling;
D O I
10.1016/j.microrel.2019.06.046
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A Printed Circuit Board assembly (PCBA) testing approach using infrared thermal signatures is presented. The concept of thermal signature for PCBAs is introduced and proven by experience and simulation. Based on this concept, the testing method is able to detect assembly defects such as presence of the component, polarity, value and solder (shorts and opens) and in some cases component health state, it also can classify the components mounted on the PCB into two classes (fault-free, faulty). According to the thermal signature of each component on the PCBA, they can be also classified in the same classes. In this article, focus is put on capacitor defects in a DC/DC converter, especially capacitor value defects. Therefore, they will be the main tested components. For a robust detection of multiple defect scenarios, the Principal Component Analysis (PCA) method is used as an outlier detection algorithm.
引用
收藏
页数:7
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