T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics

被引：22

作者：

Li, Haoyuan ^{[1
]}

Li, Hua ^{[1
]}

Li, Zhiwei ^{[1
]}

Lin, Fuchang ^{[1
]}

Liu, De ^{[1
]}

Wang, Wenjuan ^{[1
]}

Wang, Bowen ^{[1
]}

Xu, Zhijian ^{[1
]}

机构：

[1] Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol, Wuhan 430074, Hubei, Peoples R China

来源：

MICROELECTRONICS RELIABILITY | 2015年 / 55卷 / 06期

基金：

中国国家自然科学基金;

关键词：

Metallized polypropylene film capacitor; Segment metallized film; Fuse; Self-healing; Self-healing failure; Simulation; DIELECTRIC-BREAKDOWN;

D O I：

10.1016/j.microrel.2015.03.006

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The breakdown happens in metallized polypropylene film (MPPF) capacitor can be classified into two cases: the first one is self-healing, which means that the insulation will recover after the breakdown; the other one is self-healing failure, which means that the capacitor will fail because of short-circuit fault. In this paper, the MPPF capacitor applied in DC filtering which adopt the T pattern segment film technology is investigated. To simulate the two cases mentioned above, a model based on self-healing experiment data is built by Power Systems Computer Aided Design (PSCAD). The current density flowing through the fuse and fuse energy is calculated and analyzed. Meanwhile, the fuse burn-out criteria are investigated according to electrical explosion theory and phase transition energy of segment metallized film fuse. The fuse design methodology of T pattern segment film is presented and a design case is provided. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：945 / 951

页数：7

共 24 条

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