A 0.8-1.2 V 10-50 MS/s 13-bit Subranging Pipelined-SAR ADC Using a Temperature-Insensitive Time-Based Amplifier

被引:42
作者
Zhang, Minglei [1 ,2 ,3 ]
Noh, Kyoohyun [2 ]
Fan, Xiaohua [1 ,3 ]
Sanchez-Sinencio, Edgar [2 ]
机构
[1] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[2] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX 77843 USA
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
关键词
Analog-to-digital converter (ADC); dynamic amplifier; open-loop amplifier; pipelined-successive approximation register (SAR); residue amplifier; SAR; subranging; switched capacitor (SC); switching scheme; temperature insensitive; CMOS; DB;
D O I
10.1109/JSSC.2017.2742523
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an energy-efficient 13-bit 10-50 MS/s subranging pipelined-successive approximation register (SAR) analog-to-digital converter (ADC) with power supply scaling. In the presented ADC, an SAR-assisted subranging floating capacitive DAC switching algorithm reduces switching energy along with enhanced linearity and speed in the first-stage SAR ADC. A following temperature-insensitive time-based residue amplifier realizes open-loop residual amplification without background calibration, while maintaining the benefits of dynamic operation and noise filtering. Furthermore, asynchronous SAR control logic employs a pre-window technique to accelerate SAR logic operations. The prototype ADC was fabricated in a 130-nm CMOS process with an active area of 0.22 mm(2). With a 1.2-V power supply and a Nyquist frequency input, the ADC consumes 1.32 mW at 50 MS/s and achieves signal-to-noise and distortion ratio and spurious-free dynamic range of 69.1 and 80.7 dB, respectively. The operating speed is scalable from 10 to 50 MS/s with a scalable power supply range of 0.8-1.2 V. Walden FoMs of 4-11.3 fJ/conversion-step are achieved.
引用
收藏
页码:2991 / 3005
页数:15
相关论文
共 32 条
[1]   Phase noise and jitter in CMOS ring oscillators [J].
Abidi, Asad A. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (08) :1803-1816
[2]  
Ali AMA, 2014, ISSCC DIG TECH PAP I, V57, P482, DOI 10.1109/ISSCC.2014.6757522
[3]  
[Anonymous], P IEEE CUST INT CIRC
[4]  
[Anonymous], S VLSI CIRC JUN
[5]  
Boo HH, 2015, ISSCC DIG TECH PAP I, V58, P282, DOI 10.1109/ISSCC.2015.7063036
[6]   A 12b, 50 MS/s, Fully Differential Zero-Crossing Based Pipelined ADC [J].
Brooks, Lane ;
Lee, Hae-Seung .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2009, 44 (12) :3329-3343
[7]  
Chien-Hung Kuo, 2011, 37th European Solid State Circuits Conference (ESSCIRC 2011), P475, DOI 10.1109/ESSCIRC.2011.6045010
[8]   500-MS/s 5-bit ADC in 65-nm CMOS with split capacitor array DAC [J].
Ginsburg, Brian P. ;
Chandrakasan, Anantha P. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2007, 42 (04) :739-747
[9]  
Guerber J, 2012, IEEE INT SYMP CIRC S, P2361, DOI 10.1109/ISCAS.2012.6271770
[10]   Merged capacitor switching based SAR ADC with highest switching energy-efficiency [J].
Hariprasath, V. ;
Guerber, J. ;
Lee, S. -H. ;
Moon, U. -K. .
ELECTRONICS LETTERS, 2010, 46 (09) :620-U35