A clock distribution network for microprocessors

被引:183
作者
Restle, PJ [1 ]
McNamara, TG
Webber, DA
Camporese, PJ
Eng, KF
Jenkins, KA
Allen, DH
Rohn, MJ
Quaranta, MP
Boerstler, DW
Alpert, CJ
Carter, CA
Bailey, RN
Petrovick, JG
Krauter, BL
McCredie, BD
机构
[1] IBM Corp, TJ Watson Res Ctr, Yorktown Heights, NY 10598 USA
[2] IBM Corp, Rochester, MN 55901 USA
[3] IBM Corp, Austin, TX 78758 USA
[4] IBM Corp, Poughkeepsie, NY 12601 USA
[5] Agere Syst, Austin, TX 78758 USA
关键词
circuit tuning; clock distribution; inductance; interconnect analysis; transmission lines; visualization;
D O I
10.1109/4.918917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A global clock distribution strategy used on several microprocessor chips is described, The clock network consists of buffered tunable trees or treelike networks, with the final level of trees all driving a single common grid covering most of the chip. This topology combines advantages of both trees and grids. A new tuning method was required to efficiently tune such a large strongly connected interconnect network consisting of up to 6 m of wire and modeled with 50000 resistors, capacitors, and inductors, Variations are described to handle different floor-planning styles. Global clock skew as low as 22 ps on large microprocessor chips has been measured.
引用
收藏
页码:792 / 799
页数:8
相关论文
共 11 条
[1]   A 0.2-μm, 1.8-V, SOI, 550-MHz, 64-b PowerPC microprocessor with copper interconnects [J].
Aipperspach, AG ;
Allen, DH ;
Cox, DT ;
Phan, NV ;
Storino, SN .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (11) :1430-1435
[2]   When are transmission-line effects important for on-chip interconnections? [J].
Deutsch, A ;
Kopcsay, GV ;
Restle, PJ ;
Smith, HH ;
Katopis, G ;
Becker, WD ;
Coteus, PW ;
Surovic, CW ;
Rubin, BJ ;
Dunne, RP ;
Gallo, T ;
Jenkins, KA ;
Terman, LM ;
Dennard, RH ;
SaiHalasz, GA ;
Krauter, BL ;
Knebel, DR .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (10) :1836-1846
[3]   A 200-MHZ 64-B DUAL-ISSUE CMOS MICROPROCESSOR [J].
DOBBERPUHL, DW ;
WITEK, RT ;
ALLMON, R ;
ANGLIN, R ;
BERTUCCI, D ;
BRITTON, S ;
CHAO, L ;
CONRAD, RA ;
DEVER, DE ;
GIESEKE, B ;
HASSOUN, SMN ;
HOEPPNER, GW ;
KUCHLER, K ;
LADD, M ;
LEARY, BM ;
MADDEN, L ;
MCLELLAN, EJ ;
MEYER, DR ;
MONTANARO, J ;
PRIORE, DA ;
RAJAGOPALAN, V ;
SAMUDRALA, S ;
SANTHANAM, S .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1992, 27 (11) :1555-1567
[4]  
HOFSTEE P, 2000, IEEE INT SOL STAT CI, P92
[5]  
MCCREDIE B, 1999, HOT CHIPS 11 S HIGH
[6]  
MCPHERSON T, 2000, ISSCC, P96
[7]  
Northrop G., 1999, ISSCC, P88
[8]  
Restle P., 1999, Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361), P904, DOI 10.1109/DAC.1999.782218
[9]   Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor [J].
Restle, PJ ;
Jenkins, KA ;
Deutsch, A ;
Cook, PW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (04) :662-665
[10]  
RUSU S, 1999, P DAC JUN, P904