Effect of precursor stoichiometry on morphology, phase purity, and texture formation of hot filament CVD diamond films grown on Si (100) substrate

被引:8
作者
Ahmed, Raju [1 ]
Siddique, Anwar [1 ]
Saha, Rony [1 ]
Anderson, Jonathan [1 ]
Engdahl, Chris [2 ]
Holtz, Mark [1 ,3 ]
Piner, Edwin [1 ,3 ]
机构
[1] Texas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USA
[2] Crystallume Inc, 3397 De La Cruz Blvd, Santa Clara, CA 95054 USA
[3] Texas State Univ, Dept Phys, San Marcos, TX 78666 USA
基金
美国国家科学基金会;
关键词
CHEMICAL-VAPOR-DEPOSITION; METHANE CONCENTRATION; ALGAN/GAN HEMT; MECHANISM; KINETICS; SURFACE; STRESS; PLASMA;
D O I
10.1007/s10854-020-03395-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of precursor stoichiometry is reported on morphology, phase purity, and texture formation of polycrystalline diamond films. The diamond films were deposited on 100-mm Si (100) substrates using hot filament chemical vapor deposition at substrate temperature 720-750 degrees C using a mixture of methane and hydrogen. The gas mixture was varied with methane concentrations 1.5% to 4.5%. Diamond film thickness and average grain size both increase with increasing methane concentration. Diamond quality was checked using surface and cross-section by ultraviolet micro-Raman spectroscopy. The data show consistent diamond properties across the surface of the film and along the cross-section. XRD pole figure analyses of the films show that 3.0% methane results in preferential orientation of diamond in the < 111 & rang; direction, whereas films deposited with 4.5% methane showed texture along the < 220 & rang; direction in addition to < 111 & rang; which was tilted - 23 degrees with respect to the surface normal.
引用
收藏
页码:8597 / 8606
页数:10
相关论文
共 49 条
[1]   Selective Area Deposition of Hot Filament CVD Diamond on 100 mm MOCVD Grown AIGaN/GaN Wafers [J].
Ahmed, Raju ;
Siddique, Anwar ;
Anderson, Jonathan ;
Engdahl, Chris ;
Holtz, Mark ;
Piner, Edwin .
CRYSTAL GROWTH & DESIGN, 2019, 19 (02) :672-677
[2]   Ultraviolet micro-Raman stress map of polycrystalline diamond grown selectively on silicon substrates using chemical vapor deposition [J].
Ahmed, Raju ;
Nazari, M. ;
Hancock, B. L. ;
Simpson, J. ;
Engdahl, C. ;
Piner, E. L. ;
Holtz, M. W. .
APPLIED PHYSICS LETTERS, 2018, 112 (18)
[3]   Low temperature hot filament chemical vapor deposition of Ultrananocrystalline Diamond films with tunable sheet resistance for electronic power devices [J].
Alcantar-Pena, J. J. ;
Montes, J. ;
Arellano-Jimenez, M. J. ;
Aguilar, J. E. Ortega ;
Berman-Mendoza, D. ;
Garcia, R. ;
Yacaman, M. J. ;
Auciello, O. .
DIAMOND AND RELATED MATERIALS, 2016, 69 :207-213
[4]   Surface morphology, growth rate and quality of diamond films synthesized in hot filament CVD system under various methane concentrations [J].
Ali, M. ;
Urgen, M. .
APPLIED SURFACE SCIENCE, 2011, 257 (20) :8420-8426
[5]   Simultaneous determination of the lattice thermal conductivity and grain/grain thermal resistance in polycrystalline diamond [J].
Anaya, J. ;
Bai, T. ;
Wang, Y. ;
Li, C. ;
Goorsky, M. ;
Bougher, T. L. ;
Yates, L. ;
Cheng, Z. ;
Graham, C. S. ;
Hobart, K. D. ;
Feygelson, T. I. ;
Tadjer, M. J. ;
Anderson, T. J. ;
Pate, B. B. ;
Kuball, M. .
ACTA MATERIALIA, 2017, 139 :215-225
[6]  
Anderson J., 2019, Microscopy and Microanalysis, V25, P1788, DOI [10.1017/S143192761900967X, DOI 10.1017/S143192761900967X]
[7]  
[Anonymous], ADV XRAY ANAL
[8]   THIN-FILM DIAMOND BY CHEMICAL-VAPOR-DEPOSITION METHODS [J].
ASHFOLD, MNR ;
MAY, PW ;
REGO, CA ;
EVERITT, NM .
CHEMICAL SOCIETY REVIEWS, 1994, 23 (01) :21-30
[9]   Status review of the science and technology of ultrananocrystalline diamond (UNCD™) films and application to multifunctional devices [J].
Auciello, Orlando ;
Sumant, Anirudha V. .
DIAMOND AND RELATED MATERIALS, 2010, 19 (7-9) :699-718
[10]   INFLUENCE OF GAS-PHASE PARAMETERS ON THE DEPOSITION KINETICS AND MORPHOLOGY OF THIN DIAMOND FILMS DEPOSITED BY HFCVD AND MWCVD TECHNIQUE [J].
BECKMANN, R ;
KULISCH, W ;
FRENCK, HJ ;
KASSING, R .
DIAMOND AND RELATED MATERIALS, 1992, 1 (2-4) :164-167