Magnetocapacitance effects of Pb0.7Sr0.3TiO3/La0.7Sr0.3MnO3 thin film on Si substrate

被引:16
作者
Chen, Ying [1 ,2 ]
Wang, Genshui [1 ]
Zhang, Shuai [1 ]
Lei, Xiuyun [1 ]
Zhu, Junyu [3 ]
Tang, Xiaodong [3 ]
Wang, Yongling [1 ]
Dong, Xianlin [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Funct Mat & Devices, Shanghai 200050, Peoples R China
[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
[3] E China Normal Univ, Minist Educ, Key Lab Polar Mat & Devices, Dept Elect Engn, Shanghai 200241, Peoples R China
关键词
MAGNETORESISTANCE; MICROSTRUCTURE; TRANSITION;
D O I
10.1063/1.3552969
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pb0.7Sr0.3TiO3 / La0.7Sr0.3MnO3 (PST/LSMO) thin film has been deposited on Si substrate by chemical solution deposition. Obvious changes in dielectric constant and loss as functions of frequency and magnetic field were observed in PST/LSMO thin film. By applying both dc bias electric and magnetic fields, apparent dielectric anomalies were observed in the "butterfly-hysteresis" curves. These effects may be useful for practical application. The mechanism for the magnetocapacitance effects in PST/LSMO is rationalized by combining the Maxwell-Wagner capacitor model and the magnetoresistivity and magnetostriction of the LSMO. (C) 2011 American Institute of Physics. [doi:10.1063/1.3552969]
引用
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页数:3
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