AFM observation of force on a dielectric sphere in the evanescent field of totally reflected light

被引:10
作者
Vilfan, M
Musevic, I
Copic, M
机构
[1] Jozef Stefan Inst, Ljubljana, Slovenia
[2] Univ Ljubljana, Dept Phys, Ljubljana 61000, Slovenia
来源
EUROPHYSICS LETTERS | 1998年 / 43卷 / 01期
关键词
D O I
10.1209/epl/i1998-00316-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present the first direct measurement of the radiation pressure force acting on a sphere in the evanescent field of a totally reflected light beam using the atomic force microscope (AFM). A dielectric sphere was attached to the AFM cantilever and placed into the evanescent light field of the Ar-laser beam illuminating a sapphire prism surface at an angle larger than the critical. A repulsive force due to the evanescent field was observed. The force decreases exponentially with the characteristic length of (45 +/- 20) nm as the distance between the sphere and the total reflection surface increases. The measured magnitude of the force close to the surface is (3 +/- 1.5) 10(-10) N. Both the magnitude and the decay length are in good agreement with the calculated values.
引用
收藏
页码:41 / 46
页数:6
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