Real-time atomic force microscopy in lubrication condition

被引：3

作者：

Lee, Hyunsoo ^{[1
]}

Lee, Donghyeok ^{[1
]}

Kim, K. B. ^{[1
]}

Seo, Yongho ^{[1
]}

Kim, Hyunsook ^{[2
]}

Lee, Haiwon ^{[2
]}

机构：

[1] Sejong Univ, Fac Nanotechnol & Adv Mat Engn, Seoul 143747, South Korea

[2] Hanyang Univ, Dept Chem, Seoul 133791, South Korea

来源：

ULTRAMICROSCOPY | 2010年 / 110卷 / 07期

关键词：

AFM; Fast scanning; Real-time; Atomic force microscopy; Lubrication condition; tip modification; WEAR;

D O I：

10.1016/j.ultramic.2010.02.045

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：826 / 830

页数：5

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