Real-time atomic force microscopy in lubrication condition

被引：3
作者：
Lee, Hyunsoo [1 ]
Lee, Donghyeok [1 ]
Kim, K. B. [1 ]
Seo, Yongho [1 ]
Kim, Hyunsook [2 ]
Lee, Haiwon [2 ]
机构：
[1] Sejong Univ, Fac Nanotechnol & Adv Mat Engn, Seoul 143747, South Korea
[2] Hanyang Univ, Dept Chem, Seoul 133791, South Korea
来源：
ULTRAMICROSCOPY | 2010年 / 110卷 / 07期
关键词：
AFM; Fast scanning; Real-time; Atomic force microscopy; Lubrication condition; tip modification; WEAR;
D O I：
10.1016/j.ultramic.2010.02.045
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：826 / 830
页数：5
相关论文
共 50 条
  • [21] Synchronizing atomic force microscopy force mode and fluorescence microscopy in real time for immune cell stimulation and activation studies
    Cazaux, Severine
    Sadoun, Anais
    Biarnes-Pelicot, Martine
    Martinez, Manuel
    Obeid, Sameh
    Bongrand, Pierre
    Limozin, Laurent
    Puech, Pierre-Henri
    ULTRAMICROSCOPY, 2016, 160 : 168 - 181
  • [22] Atomic force microscopy
    Musevic, I
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2000, 30 (04): : 223 - 227
  • [23] Real-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100-x chalcogenide films
    Trunov, M. L.
    Lytvyn, P. M.
    Nagy, P. M.
    Dyachyns'ka, O. M.
    APPLIED PHYSICS LETTERS, 2010, 96 (11)
  • [24] Real-time Topography and Hamaker Constant Estimation in Atomic Force Microscopy Based on Adaptive Fading Extended Kalman Filter
    Milad Seifnejad Haghighi
    Hossein Nejat Pishkenari
    International Journal of Control, Automation and Systems, 2021, 19 : 2455 - 2467
  • [25] Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy
    Fukuma, Takeshi
    Yoshioka, Shunsuke
    Asakawa, Hitoshi
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (07)
  • [26] Real-time Topography and Hamaker Constant Estimation in Atomic Force Microscopy Based on Adaptive Fading Extended Kalman Filter
    Haghighi, Milad Seifnejad
    Pishkenari, Hossein Nejat
    INTERNATIONAL JOURNAL OF CONTROL AUTOMATION AND SYSTEMS, 2021, 19 (07) : 2455 - 2467
  • [27] Study on morphology and lubrication of articular cartilage surface with atomic force microscopy
    Sawae, Y
    Murakami, T
    Matsumoto, K
    Horimoto, M
    JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, 2000, 45 (02) : 150 - 157
  • [28] Time-Resolved Single Molecule Microscopy coupled with Atomic Force Microscopy
    Koenig, M.
    Koberling, F.
    Schulz, O.
    Ros, R.
    Fore, S.
    Sackrow, M.
    Trautmann, S.
    Erdmann, R.
    THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING XIX, 2012, 8227
  • [29] Correlative atomic force microscopy quantitative imaging-laser scanning confocal microscopy quantifies the impact of stressors on live cells in real-time
    Bhat, Supriya V.
    Sultana, Taranum
    Koernig, Andre
    McGrath, Seamus
    Shahina, Zinnat
    Dahms, Tanya E. S.
    SCIENTIFIC REPORTS, 2018, 8
  • [30] Induced structural changes of a supported planar bilayer after exposure to halothane - A real-time atomic force microscopy study
    Shamrakov, LG
    Cramb, DT
    CANADIAN JOURNAL OF CHEMISTRY, 2005, 83 (08) : 1190 - 1194
12345