Effect of Hf on structure and age hardening of Ti-Al-N thin films

被引:47
|
作者
Rachbauer, R. [1 ]
Blutmager, A. [1 ,2 ]
Holec, D. [1 ]
Mayrhofer, P. H. [1 ]
机构
[1] Montanauniv Leoben, Dept Phys Met & Mat Testing, A-8700 Leoben, Austria
[2] Ulbrich Austria GmbH, A-7052 Mullendorf, Austria
来源
SURFACE & COATINGS TECHNOLOGY | 2012年 / 206卷 / 10期
基金
奥地利科学基金会;
关键词
Ab initio; Oxidation; TiAlN; TiAlHfN; Ti-Al-Hf-N; Ti-Hf-N; MECHANICAL-PROPERTIES; TI1-XALXN COATINGS; ELECTRONIC ORIGIN; TRANSITION; DECOMPOSITION;
D O I
10.1016/j.surfcoat.2011.11.020
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Protective coatings for high temperature applications, as present e.g. during cutting and milling operations, require excellent mechanical and thermal properties during work load. The Ti1-xAlxN system is industrially well acknowledged as it covers some of these requirements, and even exhibits increasing hardness with increasing temperature in its cubic modification, known as age hardening. The thermally activated diffusion at high temperatures however enables for the formation of wurtzite AlN, which causes a rapid reduction of mechanical properties in Ti1-xAlxN coatings. The present work investigates the possibility to increase the formation temperature of w-AlN due to Hf alloying up to 10 at.% at the metal sublattice of Ti1-xAlxN films. Ab initio predictions on the phase stability and decomposition products of quaternary Ti1-x-yAlxHfyN alloys, as well as the ternary Ti1-xAlxN, Hf1-xAlxN and Ti1-zHfzN systems, facilitate the interpretation of the experimental findings. Vacuum annealing treatments from 600 to 1100 degrees C indicate that the isostructural decomposition, which is responsible for age hardening, of the Ti1-x-yAlxHfyN films starts at lower temperatures than the ternary Ti1-xAlxN coating. However, the formation of a dual phase structure of c-Ti1-zHfzN (with z = y/(1 x)) and w-AlN is shifted to similar to 200 degrees C higher temperatures, thus retaining a film hardness of similar to 40 GPa up to similar to 1100 degrees C, while the Hf free films reach the respective hardness maximum of similar to 38 GPa already at similar to 900 degrees C. Additional annealing experiments at 850 and 950 degrees C for 20 h indicate a substantial improvement of the oxidation resistance with increasing amount of Hf in Ti1-x-yAlxHfyN. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2667 / 2672
页数:6
相关论文
共 50 条
  • [1] Decomposition pathways in age hardening of Ti-Al-N films
    Rachbauer, R.
    Massl, S.
    Stergar, E.
    Holec, D.
    Kiener, D.
    Keckes, J.
    Patscheider, J.
    Stiefel, M.
    Leitner, H.
    Mayrhofer, P. H.
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (02)
  • [2] Hardening and toughening of Ti-Al-N thin films through the solid solution of Ni
    Xu, Yu X.
    Ding, Yuchen
    Peng, Bin
    Zhang, Quan
    Wang, Qimin
    SURFACE & COATINGS TECHNOLOGY, 2024, 493
  • [3] Hardening mechanisms of nanocrystalline Ti-Al-N solid solution films
    Liu, ZJ
    Shum, PW
    Shen, YG
    THIN SOLID FILMS, 2004, 468 (1-2) : 161 - 166
  • [4] Influence of Yttrium on the Thermal Stability of Ti-Al-N Thin Films
    Moser, Martin
    Kiener, Daniel
    Scheu, Christina
    Mayrhofer, Paul H.
    MATERIALS, 2010, 3 (03): : 1573 - 1592
  • [5] Pseudomorphic stabilization on crystal structure and mechanical properties of nanocomposite Ti-Al-N thin films
    Karimi, A
    Vasco, T
    Santana, A
    SURFACE ENGINEERING 2004 - FUNDAMENTALS AND APPLICATIONS, 2005, 843 : 161 - 166
  • [6] Effect of deposition temperature on the physico-chemical behavior of Ti-Al-N thin films
    Seal, S
    Kale, A
    Desai, V
    Jimenez, D
    Sundaram, K
    Dahotre, NB
    Shah, S
    SURFACE ENGINEERING: IN MATERIALS SCIENCE I, 2000, : 403 - 413
  • [7] Effect of nitrogen gas on preparation of Ti-Al-N thin films by pulsed laser ablation
    Morimoto, A
    Shigeno, H
    Morita, S
    Yonezawa, Y
    Shimizu, T
    APPLIED SURFACE SCIENCE, 1998, 127 : 994 - 998
  • [8] Influence of oxygen impurities on growth morphology, structure and mechanical properties of Ti-Al-N thin films
    Riedl, H.
    Koller, C. M.
    Munnik, F.
    Hutter, H.
    Martin, F. Mendez
    Rachbauer, R.
    Kolozsvari, S.
    Bartosik, M.
    Mayrhofer, P. H.
    THIN SOLID FILMS, 2016, 603 : 39 - 49
  • [9] Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
    Rachbauer, Richard
    Holec, David
    Lattemann, Martina
    Hultman, Lars
    Mayrhofer, Paul H.
    INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2011, 102 (06) : 735 - 742
  • [10] Increased thermal stability of Ti-Al-N thin films by Ta alloying
    Rachbauer, R.
    Holec, D.
    Mayrhofer, P. H.
    SURFACE & COATINGS TECHNOLOGY, 2012, 211 : 98 - 103