Robust Toffoli gate originating from Stark shifts

被引：4
|
作者：
Shao, Xiao-Qiang [1 ]
Zheng, Tai-Yu [1 ]
Zhang, Shou [2 ]
机构：
[1] NE Normal Univ, Sch Phys, Changchun 130024, Jilin, Peoples R China
[2] Yanbian Univ, Coll Sci, Dept Phys, Yanji 133002, Jilin, Peoples R China
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2012年 / 29卷 / 06期
基金：
中国国家自然科学基金;
关键词：
QUANTUM COMPUTATION; JOSEPHSON-JUNCTIONS; TRAPPED IONS; LOGIC GATES; UNIVERSAL; RESONANCE;
D O I：
10.1364/JOSAB.29.001203
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A method for synthesizing the Toffoli gate is proposed based solely on the Stark shifts of three superconducting quantum interference devices (SQUIDs). This scheme is robust against the effect of decoherence, since it operates with no excitation of SQUIDs and the coplanar waveguide cavity. The obtained fidelity of the Toffoli gate is high, corresponding to the current typical experimental parameters, and an equivalent physical model for conveniently addressing qubits is also constructed in the coupled-cavity array system. (C) 2012 Optical Society of America
引用
收藏
页码：1203 / 1207
页数：5
相关论文
共 50 条
  • [31] Obtaining ligand geometries from paramagnetic shifts in low-spin haem proteins
    David L. Turner
    Journal of Biological Inorganic Chemistry, 2000, 5 : 328 - 332
  • [32] Calculating NMR Chemical Shifts for Paramagnetic Metal Complexes from First-Principles
    Gendron, Frederic
    Sharkas, Kamal
    Autschbach, Jochen
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2015, 6 (12): : 2183 - 2188
  • [33] A Genuine Jahn-Teller System with Compressed Geometry and Quantum Effects Originating from Zero-Point Motion
    Antonio Aramburu, Jose
    Garcia-Fernandez, Pablo
    Maria Garcia-Lastra, Juan
    Moreno, Miguel
    CHEMPHYSCHEM, 2016, 17 (14) : 2146 - 2156
  • [34] Photogalvanic effects originating from the violation of the Einstein relation in a 2D electron gas in high Landau levels
    Dmitriev, I. A.
    Dorozhkin, S. I.
    Mirlin, A. D.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2010, 42 (04): : 1159 - 1162
  • [35] Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors
    Watkins, A. C.
    Vibbert, S. T.
    D'Amico, J., V
    Kauppila, J. S.
    Haeffner, T. D.
    Ball, D. R.
    Zhang, E. X.
    Warren, K. M.
    Alles, M. L.
    Massengill, L. W.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, 69 (03) : 374 - 380
  • [36] Gate tunable terahertz cyclotron emission from two-dimensional Dirac fermions
    Benhamou-Bui, B.
    Consejo, C.
    Krishtopenko, S. S.
    Szola, M.
    Maussang, K.
    Ruffenach, S.
    Chauveau, E.
    Benlemqwanssa, S.
    Bray, C.
    Baudry, X.
    Ballet, P.
    Morozov, S. V.
    Gavrilenko, V. I.
    Mikhailov, N. N.
    Dvoretskii, S. A.
    Jouault, B.
    Torres, J.
    Teppe, F.
    APL PHOTONICS, 2023, 8 (11)
  • [37] Trench Gate Nanosheet FET to Suppress Leakage Current From Substrate Parasitic Channel
    Lee, Khwang-Sun
    Yang, Byung-Do
    Park, Jun-Young
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (04) : 2042 - 2046
  • [38] Configurable NOR gate arrays from Belousov-Zhabotinsky micro-droplets
    Wang, A. L.
    Gold, J. M.
    Tompkins, N.
    Heymann, M.
    Harrington, K. I.
    Fraden, S.
    EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 2016, 225 (01): : 211 - 227
  • [39] Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response
    Clark, Lawrence T.
    Young-Sciortino, Clifford S.
    Guertin, Steven M.
    Brown, William E.
    Holbert, Keith E.
    Bikkina, Phaneendra
    Bhanushali, Sumukh
    Levy, Andrew
    Turowski, Marek
    Butler, Jim D.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2023, 23 (01) : 162 - 171
  • [40] Structure restraints from heteronuclear pseudocontact shifts generated by lanthanide tags at two different sites
    Pearce, Benjamin J. G.
    Jabar, Shereen
    Loh, Choy-Theng
    Szabo, Monika
    Graham, Bim
    Otting, Gottfried
    JOURNAL OF BIOMOLECULAR NMR, 2017, 68 (01) : 19 - 32
12345