Probabilistic uncertainty analysis of an FRF of a structure using a Gaussian process emulator

被引:51
作者
Fricker, Thomas E. [1 ]
Oakley, Jeremy E. [2 ]
Sims, Neil D. [3 ]
Worden, Keith [3 ]
机构
[1] Univ Exeter, Math Res Inst, Exeter EX4 4QF, Devon, England
[2] Univ Sheffield, Dept Probabil & Stat, Sheffield S3 7RH, S Yorkshire, England
[3] Univ Sheffield, Dept Mech Engn, Sheffield S1 3JD, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
Finite element model; Probabilistic uncertainty analysis; Envelope frequency response function; Gaussian process; Metamodel; Bayesian; DETERMINISTIC FUNCTIONS; COMPUTER; IDENTIFICATION; PREDICTION; DESIGN;
D O I
10.1016/j.ymssp.2011.06.013
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
This paper introduces methods for probabilistic uncertainty analysis of a frequency response function (FRF) of a structure obtained via a finite element (FE) model. The methods are applicable to computationally expensive FE models, making use of a Bayesian metamodel known as an emulator. The emulator produces fast predictions of the FE model output, but also accounts for the additional uncertainty induced by only having a limited number of model evaluations. Two approaches to the probabilistic uncertainty analysis of FRFs are developed. The first considers the uncertainty in the response at discrete frequencies, giving pointwise uncertainty intervals. The second considers the uncertainty in an entire FRF across a frequency range, giving an uncertainty envelope function. The methods are demonstrated and compared to alternative approaches in a practical case study. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2962 / 2975
页数:14
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