Line width measurement of a capillary discharge soft X-ray laser

被引：0
作者：
Urbanski, L. [1 ]
Meng, L. M. [2 ]
Marconi, M. C. [1 ,3 ]
Berrill, M. [1 ,3 ]
Guilbaud, O.
Klisnick, A. [2 ]
Rocca, J. J. [1 ,3 ]
机构：
[1] Colorado State Univ, NSF ERC Extreme Ultraviolet Sci & Technol, Ft Collins, CO 80523 USA
[2] Univ Paris 11, CNRS, ISMO, Bat 350, Paris, France
[3] Univ Paris 11, CNRS, ISMO, Bat 210, Paris, France
来源：
X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS IX | 2011年 / 8140卷
关键词：
Soft X ray lasers; line-width; wave-front division interferometer; REPETITION-RATE; TEMPORAL COHERENCE;
D O I：
10.1117/12.892929
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We measured the linewidth of a lambda = 46.9 nm neon-like argon capillary discharge soft x-ray laser. A wavefront division interferometer based on a pair of dihedrons was used to resolve the laser line measuring the variation in the interference fringe visibility for different optical path differences. We measured a relative linewidths of Delta lambda/lambda = 3-4 10(-5). No significant re-broadening was observed when the length of the laser medium was increased beyond the saturation length due to effects that homogenizes the line profile.
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页数：6
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