Photoinduced Effects of UV illumination on PbZr0.30Ti0.70O3 Thin Films

被引：3

作者：

Jang, Y. H. ^{[1
,2
]}

Kim, C. H. ^{[1
,2
]}

Seo, S. J. ^{[1
,3
]}

Cho, J. H. ^{[1
,3
]}

机构：

[1] Pusan Natl Univ, Res Ctr Dielect & Adv Matter Phys, Pusan 609735, South Korea

[2] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea

[3] Pusan Natl Univ, Dept Phys Educ, Pusan 609735, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2011年 / 59卷 / 03期

基金：

新加坡国家研究基金会;

关键词：

PZT; Ferroelectric domain; KPFM; PFM; UV illumination; PROBE FORCE MICROSCOPY; STORAGE;

D O I：

10.3938/jkps.59.2579

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The photoinduced effects in PbZr0(0.30)Ti(0.70)O(3) (PZT) thin films have been investigated by applying combined measurements with atomic force microscopy (AFM), Kelvin probe force microscopy (KPFM), and piezoresponse force microscopy (PFM) imaging techniques. In this study, ferroelectric domains and photoinduced carrier distributions were measured before and after UV illumination and DC bias poling on the film's surface by using an UV light emitting diode (lambda = 310 nm). By analysis of the histogram distributions of the phase signal of the out-of-plane ferroelectric polarization, we observed that the charges trapped on the sample's surface layer by the UV illumination affected the ferroelectric domain patterns, thus changing the orientation of out-of-plane domains. In addition, we observed that because of negatively trapped charges near the film surface, the surface potential shifted to a negative value after UV illumination.

引用

页码：2579 / 2582

页数：4

共 15 条

[1] Domain dynamics in piezoresponse force spectroscopy: Quantitative deconvolution and hysteresis loop fine structure [J].