Optical scattering properties of a nano-textured ZnO-silicon interface

被引：2

作者：

Jager, K. ^{[1
]}

Schulte, M. ^{[2
]}

Bittkau, K. ^{[2
]}

Ermes, A. M. ^{[2
]}

Zeman, M. ^{[1
]}

Pieters, B. E. ^{[2
]}

机构：

[1] Delft Univ Technol, Photovolta Mat & Devices Lab, POB 5031, NL-2600 GA Delft, Netherlands

[2] Forschungszentrum Julich, Inst Energiteknikk, D-52425 Julich, Germany

来源：

INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS | 2011年 / 8001卷

关键词：

scattering; surface-textured TCO; microcrystalline silicon; ZnO; FDTD; scalar scattering theory; ray tracing; SOLAR-CELLS; LIGHT-SCATTERING; ROUGHNESS;

D O I：

10.1117/12.889943

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The scattering properties of transparent conductive oxide (TCO) layers are fundamentally related to the performance of thin film silicon solar cells. In this study we introduce an experimental technique to access light scattering properties at textured TCO-silicon interfaces. Therefore we prepared a sample with a polished microcrystalline silicon layer, which is deposited onto a rough TCO layer. We used the measured results to validate calculations obtained with rigorous diffraction theory, i.e. a numerical solution of Maxwell's equations. Furthermore we evaluated four approximate models based on the scalar scattering theory and ray tracing and compared them to the rigorous diffraction theory.

引用

页数：7