Demonstrating a threshold for trapped space charge accumulation in solid dielectrics under dc field

被引:91
作者
Dissado, LA [1 ]
Laurent, C
Montanari, GC
Morshuis, PHF
机构
[1] Univ Leicester, Leicester LE1 7RH, Leics, England
[2] Univ Toulouse 3, Lab Gen Elect, CNRS UMR 5003, Toulouse, France
[3] Univ Bologna, DIE Limat, I-40136 Bologna, Italy
[4] Delft Univ Technol, High Voltage Technol & Management, NL-2628 CD Delft, Netherlands
关键词
space charge accumulation; threshold; PEA; LIPP; PWP; electroluminescence; space charge limited conduction;
D O I
10.1109/TDEI.2005.1453467
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a discussion of the concept of threshold for trapped space charge accumulation in solid dielectrics submitted to a dc field. The starting point is the fact that it is often possible to define a critical field separating an ohmic type of conduction from a non-linear regime in the current-voltage characteristic of solid dielectrics. In the space charge limited conduction theory, this critical field corresponds to the onset of space charge accumulation. However, other conduction processes, such as hopping conduction for example, can also explain non-linearity in the current-voltage characteristic, which does not involve space charge. It is proposed to check for the existence of a critical field for space charge accumulation using complementary techniques, i.e., space charge detection and electroluminescence techniques. Polyethylene, polyester and polycarbonate were investigated as being representative of three different families of polymers. It is shown that similar values of thresholds are found for a given material using the three above-mentioned techniques, lending support to the physical explanation of a threshold for trapped space charge accumulation.
引用
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页码:612 / 620
页数:9
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