Strain-induced migration of tilt grain boundaries

被引：25
作者：
Winning, Myrjam [1 ]
机构：
[1] Max Planck Inst Iron Res GmbH, Dept Microstruct Phys & Metal Forming, D-40237 Dusseldorf, Germany
来源：
SCRIPTA MATERIALIA | 2008年 / 58卷 / 02期
关键词：
grain boundary migration; Al; X-ray diffraction; strain;
D O I：
10.1016/j.scriptamat.2007.09.034
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Experimental results showing the influence of strain on the migration of (112) tilt grain boundaries in Al bicrystals are presented. The bicrystals were deformed in a channel-die experiment with different levels of strain and then annealed at different temperatures. The migration of the boundaries was measured in situ by X-ray diffraction. The activation enthalpies were determined from the in situ data and it is shown that the strain level influences the activation parameters for strain-induced grain boundary migration. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：85 / 88
页数：4
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