Helium and deuterium irradiation effects in W-Ta composites produced by pulse plasma compaction

被引:14
作者
Dias, M. [1 ]
Catarino, N. [1 ]
Nunes, D. [2 ]
Fortunato, E. [2 ]
Nogueira, I. [3 ]
Rosinki, M. [4 ]
Correia, J. B. [5 ]
Carvalho, P. A. [1 ,6 ]
Alves, E. [1 ]
机构
[1] Univ Lisbon, Inst Plasmas & Fusao Nucl, Inst Super Tecn, Ave Rovisco Pais, P-1049001 Lisbon, Portugal
[2] Univ Nova Lisboa, CENIMAT I3N, Dept Ciencia Mat, FCT, P-2829516 Caparica, Portugal
[3] Univ Lisbon, Inst Super Tecn, CEFEMA, Ave Rovisco Pais, P-1049001 Lisbon, Portugal
[4] GeniCore, Warsaw, Poland
[5] LNEG, Estr Paco do Lumiar, P-1649038 Lisbon, Portugal
[6] SINTEF Mat & Chem, Forskningsveien 1, N-0314 Oslo, Norway
关键词
Tungsten-tantalum fiber composites; Mechanical alloying; Helium implantation; Deuterium implantation; Blistering; Fuzz; LOW-ENERGY; TUNGSTEN SURFACE; MICROSTRUCTURE; IMPLANTATION; MECHANISM; METALS; GROWTH;
D O I
10.1016/j.jnucmat.2017.05.007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Tungsten-tantalum composites have been envisaged for first-wall components of nuclear fusion reactors; however, changes in their microstructure are expected from severe irradiation with helium and hydrogenic plasma species. In this study, composites were produced from ball milled W powder mixed with 10 at.% Ta fibers through consolidation by pulse plasma compaction. Implantation was carried out at room temperature with He (30 keV) or D+ (15 keV) or sequentially with He and D+ using ion beams with fluences of 5 x 10(21) at/m(2). Microstructural changes and deuterium retention in the implanted composites were investigated by scanning electron microscopy, coupled with focused ion beam and energy dispersive X-ray spectroscopy, transmission electron microscopy, X-ray diffraction, Rutherford backscattering spectrometry and nuclear reaction analysis. The composite materials consisted of Ta fibers dispersed in a nanostructured W matrix, with Ta2O5 layers at the interfacial regions. The Ta and Ta2O5 surfaces exhibited blisters after He+ implantation and subsequent D+ implantation worsened the blistering behavior of Ta2O5. Swelling was also pronounced in Ta2O5 where large blisters exhibited an internal nanometer-sized fuzz structure. Transmission electron microscopy revealed an extensive presence of dislocations in the metallic phases after the sequential implantation, while a relatively low density of defects was detected in Ta2O5. This behavior may be partially justified by a shielding effect from the blisters and fuzz structure developed progressively during implantation. The tungsten peaks in the X-ray diffractograms were markedly shifted after He+ implantation, and even more so after the sequential implantation, which is in agreement with the increased D retention inferred from nuclear reaction analysis. (C) 2017 Published by Elsevier B.V.
引用
收藏
页码:105 / 112
页数:8
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