Thermoplasmonic shift and dispersion in thin metal films

被引:26
作者
Lereu, A. L. [1 ,2 ]
Passian, A. [2 ,3 ]
Farahi, R. H. [2 ]
van Hulst, N. F. [1 ,4 ]
Ferrell, T. L. [3 ]
Thundat, T. [2 ,3 ]
机构
[1] Inst Ciencies Foton ICFO, Barcelona 08860, Spain
[2] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[3] Univ Tennessee, Dept Phys & Astron, Knoxville, TN 37996 USA
[4] ICREA, Barcelona 08015, Spain
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2008年 / 26卷 / 04期
关键词
D O I
10.1116/1.2900713
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In 2004, the authors reported two coupling schemes based on the thermo-optic properties of thin metallic films and their associated sub- and superstrates, by utilizing surface plasmons. These studies showed a potential for all-optical modulation at low rates that may be used for sensing purposes. In this article, they continue by investigating thermal processes involved in thin metallic films with different approaches. They first experimentally imaged the shift of the surface plasmon dispersion relation in the visible spectrum, as the thin film temperature is externally varied. They then reinforce the previous observations by collecting the absorption curves at selected visible photon energies of excitation, as the film temperature in the excitation region increases. Utilizing the absorption measurements, they briefly address how one may obtain the real and imaginary parts of the index of refraction of the thin film as a function of temperature for each involved wavelength. Finally, they investigate the local physical state of the film by optically profiling the surface plasmon excitation region. (C) 2008 American Vacuum Society.
引用
收藏
页码:836 / 841
页数:6
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