Test Generation by Constraint Solving and FSM Mutant Killing

被引:4
|
作者
Petrenko, Alexandre [1 ]
Timo, Omer Nguena [1 ]
Ramesh, S. [2 ]
机构
[1] CRIM, Montreal, PQ, Canada
[2] GM Global R&D, Warren, MI USA
来源
TESTING SOFTWARE AND SYSTEMS, ICTSS 2016 | 2016年 / 9976卷
关键词
FSM; Conformance testing; Mutation testing; Fault modelling; Fault model-based test generation; Test coverage; Fault coverage analysis; FAULTS;
D O I
10.1007/978-3-319-47443-4_3
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The problem of fault model-based test generation from formal models, in this case Finite State Machines, is addressed. We consider a general fault model which is a tuple of a specification, conformance relation and fault domain. The specification is a deterministic FSM which can be partially specified and not reduced. The conformance relation is quasi-equivalence, as all implementations in the fault domain are assumed to be completely specified FSMs. The fault domain is a set of all possible deterministic submachines of a given nondeterministic FSM, called a mutation machine. The mutation machine contains a specification machine and extends it with mutated transitions modelling potential faults. An approach for deriving a test suite which is complete (sound and exhaustive) for the given fault model is elaborated. It is based on our previously proposed method for analyzing the test completeness by logical encoding and SMT-solving. The preliminary experiments performed on an industrial controller indicate that the approach scales sufficiently well.
引用
收藏
页码:36 / 51
页数:16
相关论文
共 50 条
  • [41] An Approach to Concurrent TTCN Test Generation
    毕军
    吴建平
    Journal of Computer Science and Technology, 1999, (06) : 614 - 618
  • [42] Behavioral test generation for VHDL processes
    Gharehbaghi, AM
    Navabi, Z
    ICM 2000: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2000, : 123 - 126
  • [43] Refinement and Test Case Generation in UTP
    Aichernig, Bernhard K.
    He, Jifeng
    ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE, 2007, 187 (125-143) : 125 - 143
  • [44] Test Generation and Minimization with "Basic" Statecharts
    Belli, Fevzi
    Hollmann, Axel
    APPLIED COMPUTING 2008, VOLS 1-3, 2008, : 718 - 723
  • [45] Life Sciences-Inspired Test Case Similarity Measures for Search-Based, FSM-Based Software Testing
    Asoudeh, Nesa
    Labiche, Yvan
    MODELLING FOUNDATIONS AND APPLICATIONS (ECMFA 2018), 2018, 10890 : 199 - 215
  • [46] A Coevolutionary Algorithm to Automatic Test Case Selection and Mutant in Mutation Testing
    Lobo de Oliveira, Andre Assis
    Camilo-Junior, Celso Goncalves
    Vincenzi, Auri M. R.
    2013 IEEE CONGRESS ON EVOLUTIONARY COMPUTATION (CEC), 2013, : 829 - 836
  • [47] GAmera: An Automatic Mutant Generation System for WS-BPEL Compositions
    Jose Dominguez-Jimenez, Juan
    Estero-Botaro, Antonia
    Garcia-Dominguez, Antonio
    Medina-Bulo, Inmaculada
    ECOWS'09: PROCEEDINGS OF THE 7TH IEEE EUROPEAN CONFERENCE ON WEB SERVICES, 2009, : 97 - 106
  • [48] TOWARDS HIGHER-ORDER MUTANT GENERATION FOR WS-BPEL
    Blanco-Munoz, E.
    Garcia-Dominguez, A.
    Domiguez-Jimenez, J. J.
    Medina-Bulo, I.
    2011 PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON E-BUSINESS (ICE-B 2011), 2011, : 143 - 148
  • [49] Augmenting test case generation using statechart
    Chen, J
    Malaiya, YK
    SERP'04: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING RESEARCH AND PRACTICE, VOLS 1 AND 2, 2004, : 608 - 614
  • [50] Automated test generation from SDL specifications
    Kerbrat, A
    Jéron, T
    Groz, R
    SDL'99: THE NEXT MILLENNIUM, 1999, : 135 - 151